FT-8200 雙電四探針粉末電阻率測試儀
發布時間： 2023-06-12 14:57:48 點擊： 828
雙電四探針粉末電阻率測試儀
一、功能概述：
瑞柯FT-8200雙電四探針粉末電阻率測試系統（智能型）量程方阻測量范圍、可測量到-5次方或-6次方，采用集成電路模塊；智能一體化結構設計，整體大方， USB，232通訊接口，高精恒直流恒流源 ，提供四探針法和四端法兩種測量模式并存， 全程采用PC軟件操作，自動測試過程數據曲線及圖譜分析，實時分析壓強/壓力與電阻，電阻率，電導率的變化關系，及報表生成，存儲，打印等.
雙電四探針粉末電阻率測試儀
二、滿足標準：
1）四探針測試儀滿足GB/T 1551、GB/T1552-1995，ASTM F84美國A.S.T.M 標準.
The four-probe tester meets GB/T 1551, GB/t1552-1995, ASTM F84 U.S. A.S.T.M standard.
2）四探針法粉末測試平臺依據GBT 30835-2014《鋰離子電池用炭復合磷酸鐵鋰正材料》中關于粉末電導率的測定方法中用于仲裁方法的四探針法要求制作.
Four point probe method test platform based on GBT powder 30835-2014 “The lithium ion battery with carbon compound lithium iron phosphate cathode material "method for determination of the conductivity of powder in four point probe method for arbitration method in the request.
雙電四探針粉末電阻率測試儀
三、適用范圍：Scope of application
廣泛用于鋰離子電池用炭復合磷酸鐵鋰正材料電阻率的測量；也應用于需要采用四探針法測量的導體或半導體粉末材料的分析與檢測；用于石墨類粉狀材料電阻率的測量；廣泛應用于外企業品質檢測；研發部門，大中專院校；科研院所；及質量檢測機構.
Widely used in the measurement of resistivity of lithium anode materials used in lithium ion batteries.It also applies to the analysis and detection of a conductor or semiconductor powder material that needs to be measured by four probes.Measurement of resistivity of graphite powder materials;It is widely used in domestic and foreign enterprise quality testing.The research and development department, the college of major and secondary schools;Research institutes and Quality monitoring organization.
雙電四探針粉末電阻率測試儀
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規格型號/ Specification model |
FT-8200A |
FT-8200B |
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1.方塊電阻范圍sheet resistance range |
10-5～2×105Ω/□ |
10-6～2×105Ω/□ |
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2.電阻率范圍 resistivity range |
10-6～2×106Ω-cm |
10-7～2×107Ω-cm |
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電導率范圍Conductivity range |
5×10-6～106ms/cm |
5×10-7～107ms/cm |
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3.測試電流范圍 test current range |
0.1μA ，1μA，10μA，100μA，1mA，10mA，100 mA |
10μA，100μA，1mA，10mA，100 mA、1000mA |
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4.電流精度 current accuracy |
±0.1% |
±0.1% |
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軟件界面
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電阻、電阻率、方阻、溫度、單位切換、溫度系數、電流、電壓、探針形狀、探針間距、厚度 、電導率、圖譜顯示，壓力設定，zui小壓強，zui大壓強，報表導出，波形刷新，時間設定，啟動、停止、運行 resistance, resistivity, sheet resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity. Graph shows, pressure setting, minimum pressure, maximum pressure, report export, waveform refresh, time setting, start, stop, run |
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6.測試方式Test method: |
雙電組合測量 ordinary single electrical measurement |
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7.模具選購Choose to buy mold: |
：模具A內徑：20mm ；模具B:內徑10mm mold A inner diameter：20mm mold B: inner diameter 10mm |
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8.壓力選購 Choose to buy pressure: |
壓力A:0-1000kg； 壓力B:0-200kg Pressure A:0-1000kg Pressure B:0-200kg |
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9. 模腔行程：Die cavity stroke: |
0-30mm（樣品壓實厚度建議在4mm內） 0-30mm（Sample compaction thickness is recommended in 4mm） |
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10.高度測量范圍：Altimeter measurement range： |
0-25mm分辨率0.01mm位移傳感器 0.25mm resolution 0.01mm high precision laser displacement sensor |
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11. 恒壓時間：Constant pressure time: |
0-999s |
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12.整機重復性誤差： errors |
≤4.5%（平均性誤差，人為因數外） : ≤4.5% ( average error, except human factor) |
≤3%（平均性誤差，人為因數外） : ≤3% ( average error, except human factor) |
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工作電源: Power supply: |
輸入: AC 220V±10% ,50Hz功 耗：<60W input: AC 220V±10% ,50Hz <60W |
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15.選購: |
1）四探針探頭及平臺（固體半導體材料測量使用）Four probe probe head and platform 3）標準電阻。用于校準儀器 Standard resistance.Calibrated instrument |
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